The world of semiconductor manufacturing just got a new contender. Shinephi, spun out from Barcelona’s well-known Institute of Photonic Sciences (ICFO), has launched to deliver advanced interferometric imaging tech to the market.
This company grew out of more than ten years of research in optics. Shinephi’s main innovation—lateral-shear interferometric microscopy—could shake up chip and wafer inspection with a level of precision and efficiency that’s honestly hard to ignore.
From Research Lab to Industry Player
Shinephi started in July as the 13th official ICFO spinoff. The company stands on the work of Valerio Pruneri, who leads ICFO’s OPTO group and has spent years refining this imaging method.
Pruneri now acts as both technology advisor and cofounder, helping move the idea from academia into a system ready for production. That’s no small feat, considering how many innovations get stuck in the lab.
A Decade of Development
This journey relied not just on science, but on support too. ICFO’s KTT Launchpad gave Shinephi resources like business coaching, IP strategy, and important investor connections.
This kind of ecosystem helped bridge the gap between early lab prototypes and real-world market solutions. Honestly, that’s the sort of thing more research institutes should offer.
The Science Behind Lateral-Shear Interferometric Microscopy
Shinephi’s core is lateral-shear interferometric microscopy (LIM), a patented technique that takes industry standards for inspecting tiny devices and gives them a serious boost.
LIM works with impressive sensitivity and speed, all in a compact, production-friendly package. That’s a rare combo in this field.
Why LIM Stands Out
Traditional tools like optical profilometers and atomic force microscopes (AFMs) have been staples for chip and wafer measurement. But let’s be honest—they’re bulky, often slow, and not always easy to fit into fast-moving production lines.
LIM tackles these issues with:
- Higher sensitivity for catching tiny structural changes
- Greater speed for fast, inline checks
- Compact design using consumer electronic parts
- Easy integration into current semiconductor fabs
The device even looks like a regular scientific camera, which should make adoption in factories a lot less painful and expensive.
Impact on Semiconductor Manufacturing
Shinephi’s LIM tech brings a rare mix of precision, stability, and efficiency. There’s a chance it could change quality control in semiconductor and nanofabrication processes.
This matters most for photonic integrated circuits, where tolerances are measured in nanometers and the pressure for faster inspection never really lets up.
Early Adoption and Real-World Use
Some early clients have already put Shinephi’s technology to work, which says a lot about both the engineering and the market need.
CTO and cofounder Iris Cusini shared her excitement about moving from a prototype to a commercial product, and seeing customers actually benefit from what they’ve built.
ICFO’s Growing Innovation Ecosystem
Shinephi’s launch shows ICFO’s ongoing push to turn scientific ideas into real industrial impact. With thirteen startups spun out so far—and more on the way—ICFO’s reputation as a force in photonics innovation just keeps growing.
Transforming Science into Market Solutions
CEO Roland Terborg pointed out that ICFO’s collaborative structure played a key role in guiding Shinephi from a niche research project into a real deep-tech startup. This kind of model shows that, with the right people and resources, even very specialized optical tech can actually make it in tough markets.
The semiconductor industry keeps asking for faster, more accurate, and integrated inspection solutions. Shinephi looks ready to deliver on that, honestly.
They’re mixing academic rigor with practical engineering and a research-friendly environment. It’s a solid example of how photonics might be shaping the future of advanced manufacturing—and, honestly, maybe even why Barcelona’s becoming such a hotspot for deep-tech startups.
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Here is the source article for this story: Shinephi Tackles Interferometric Imaging